{"id":"arxiv/2602.03037","url":"https://arxiv.org/abs/2602.03037","tags":["quant-ph"],"score":0,"title":"Device variability of Josephson junctions induced by interface roughness","domain":"quant-ph","source":"arxiv","authors":["Yu Zhu","Félix Beaudoin","Hong Guo"],"reviews":0,"subject":"quant-ph","summary":"As quantum processors scale to large qubit numbers, device-to-device variability emerges as a critical challenge. Superconducting qubits are commonly realized using Al/AlO$_{\\text{x}}$/Al Josephson junctions operating in the tunneling regime, where even minor variations in device geometry can lead to substantial performance fluctuations. In this work, we develop a quantitative model for the variability of the Josephson energy $E_{J}$ induced by interface roughness at the Al/AlO$_{\\text{x}}$ interfaces. The roughness is modeled as a Gaussian random field characterized by two parameters: the…","category":"research","comments":0,"disputed":false,"division":"physics","mentions":0,"discussed":0,"published":"2026-02-03","reactions":{}}