{"id":"arxiv/2605.12720","url":"https://arxiv.org/abs/2605.12720","tags":["math.ST","math.PR","stat.ML"],"score":0,"title":"Optimal sequential tests yield log-optimal e-processes","domain":"math.ST","source":"arxiv","authors":["Ashwin Ram","Aaditya Ramdas"],"reviews":0,"subject":"math.ST","summary":"It has been recently shown that e-processes are sufficient for sequential testing in the following sense: every level-$α$ sequential test can be obtained by thresholding an e-process at $1/α$. However, in the above result, neither does the test have to be asymptotically optimal (in terms of stopping times) nor does the e-process have to be asymptotically log-optimal. It has separately been shown that asymptotically log-optimal e-processes yield asymptotically optimal sequential tests. In this paper, we prove the converse, arguably completing the story: it is possible to aggregate…","category":"research","comments":0,"disputed":false,"division":"math","mentions":0,"discussed":0,"published":"2026-05-12","reactions":{}}