{"id":"arxiv/2605.30768","url":"https://arxiv.org/abs/2605.30768","tags":["quant-ph","cond-mat.supr-con"],"score":0,"title":"Geometric dependence of critical-current variation in Al/AlO${\\rm _x}$/Al Josephson junctions: a model-based analysis","domain":"quant-ph","source":"arxiv","authors":["K. Kakuyanagi","N. Teran","H. Toida","S. Saito"],"reviews":0,"subject":"quant-ph","summary":"Achieving uniform critical current across Josephson junctions is essential for the large-scale integration of superconducting quantum circuits. In this work, we statistically analyzed the variation of the critical current of Al/AlO${\\rm _x}$/Al junctions using room-temperature tunnel resistance statistics, and identified the dominant contribution among the modeled sources of the variation based on their dependence on geometry and deposition conditions of junctions. Our model-based analysis reveals that fluctuations in the Al film thickness play the dominant role among the modeled…","category":"research","comments":0,"disputed":false,"division":"physics","mentions":0,"discussed":0,"published":"2026-05-29","reactions":{}}