{"id":"arxiv/2606.30340","url":"https://arxiv.org/abs/2606.30340","tags":["math.NA","math.AP"],"score":0,"title":"Adjoint-Based Bayesian Uncertainty Quantification for PDE-Constrained Inverse Problems with Application to Semiconductor Imaging","domain":"math.NA","source":"arxiv","authors":["Hassan Yazdanian","Leila Taghizadeh","Babak Maboudi Afkham"],"reviews":0,"subject":"math.NA","summary":"We formulate a Bayesian framework for reconstructing doping profiles in pn-junction semiconductor devices from boundary flux measurements. The unknown doping field is modeled as a piecewise-constant function characterized by an unknown interface and two plateau concentrations, leading to a nonlinear ill-posed inverse problem governed by a Poisson-Boltzmann-type equation. To represent this structure while enabling efficient gradient-based inference, we introduce a pushforward prior constructed by mapping a latent Gaussian field with Matérn-type covariance through a sigmoid transformation. The…","category":"research","comments":0,"disputed":false,"division":"math","mentions":0,"discussed":0,"published":"2026-06-29","reactions":{}}