{"id":"arxiv/2607.29099","url":"https://arxiv.org/abs/2607.29099","tags":["cond-mat.mes-hall","cond-mat.mtrl-sci","cond-mat.supr-con","physics.ins-det","quant-ph"],"score":0,"title":"A low-temperature ultra-high-vacuum scanning probe microscope with in situ electronic transport capabilities: from macro to nano in 10 minutes","domain":"cond-mat.mes-hall","source":"arxiv","authors":["Diego Exposito","Oscar Custance","Ivan Brihuega"],"reviews":0,"subject":"cond-mat.mes-hall","summary":"We have developed a low temperature (LT), ultra-high-vacuum (UHV) system that combines two complementary techniques, scanning probe microscopy (SPM) and electrical transport measurements, within a single platform. By providing simultaneous access to the atomic-scale surface landscape and the macroscopic device response of the same sample, the setup enables direct correlations between local structural/spectroscopic signatures and global electronic transport behavior in two-dimensional (2D) devices. The system allows experiments where atomic-scale modifications or controlled manipulations are…","category":"research","comments":0,"disputed":false,"division":"physics","mentions":0,"discussed":0,"published":"2026-07-31","reactions":{}}