{"id":"arxiv/2608.23135","url":"https://arxiv.org/abs/2608.23135","tags":["math.PR"],"score":0,"title":"Graph distance and effective resistance of the random walk trace in four and five dimensions","domain":"math.PR","source":"arxiv","authors":["Arka Adhikari","Izumi Okada","Daisuke Shiraishi"],"reviews":0,"subject":"math.PR","summary":"In this paper, we prove that the fluctuations of the graph distance and the effective resistance on the trace of a random walk in four and five dimensions converge in distribution to a stable law. In previous work, the first and second authors proved that the corresponding fluctuations converge to a Gaussian distribution in dimensions six and higher. Taken together, these results reveal a phase transition between dimensions five and six. Our proof develops a novel coupling with long range percolation, and we expect this technique to find applications in a broad class of related models.","category":"research","comments":0,"disputed":false,"division":"math","mentions":0,"discussed":0,"published":"2026-08-24","reactions":{}}