Machine Failure Detection Based on Projected Quantum Models

Larry Bowden, Qi Chu, Bernard Cena, Kentaro Ohno, Bob Parney, Deepak Sharma, Mitsuharu Takeori

arXivarxiv/2601.15641Jan 22, 2026quant-phscore 0

Detecting machine failures promptly is of utmost importance in industry for maintaining efficiency and minimizing downtime. This paper introduces a failure detection algorithm based on quantum computing and a statistical change-point detection approach. Our method leverages the potential of projected quantum feature maps to enhance the precision of anomaly detection in machine monitoring systems. We empirically validate our approach on benchmark multi-dimensional time series datasets as well as on a real-world dataset comprising IoT sensor readings from operational machines, ensuring the…

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