Structural control of two-level defect density revealed by high-throughput correlative measurements of Josephson junctions

Oliver F. Wolff, Harshvardhan Mantry, Rahim Raja, Wei-Hsiang Peng, Kaushik Singirikonda, Seungkyun Lee, Shishir Sudhaman, Rafael Goncalves, Pinshane Y. Huang, Angela Kou, Wolfgang Pfaff

arXivarxiv/2602.11469Feb 12, 2026quant-phscore 0

Materials defects in Josephson junctions (JJs), often referred to as two-level systems (TLS), couple to superconducting qubits and are a critical bottleneck for scalable quantum processors. Despite their importance, understanding the microscopic sources of TLS and how to mitigate them has remained a major challenge. Here, we demonstrate a high-throughput, correlated approach to trace the microstructural origins of strongly-coupled TLS in Josephson circuits. We assembled a massive dataset of TLS across 6,000 Al/AlOx/Al JJs and more than 600 atomic resolution transmission electron microscopy…

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