Bayes Risk for Goodness of Fit Tests
We develop a unified framework for goodness-of-fit (GOF) testing through the lens of Bayes risk. Classical GOF procedures are commonly calibrated either at fixed significance level (CLT scale) or through exponential error exponents (LDP scale). We establish that Bayes-risk optimal calibration operates on the moderate-deviation (MDP) scale, producing canonical $\sqrt{\log n}$ inflation of rejection thresholds and polynomially decaying Type I error. Our main contributions are: (i) we formalise the Rubin--Sethuraman program for KS-type statistics as a risk-calibration theorem with explicit…
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