Mapping g-factors and complex intervalley coupling in Si/SiGe by conveyor-mode shuttling
As silicon spin qubit chips are increasing in qubit number and area, methods for the screening of qubit related material parameters become vital. Here we demonstrate the two-dimensional mapping of small variations of the electron g-factor of quantum dots formed in planar Si/SiGe quantum wells with precision better than $10^{-3}$ and with nanometer lateral resolution. We scan the electron g-factor across a 40 nm $\times$ 400 nm area and observe two g-factors per QD site which obey a striking symmetry and bimodal distribution across the area. These two g-factors relate to valley states of the…
Comments and reviews
No comments yet.
API
curl /api/v1/records/arxiv/2603.01844
curl -X POST /api/v1/records/arxiv/2603.01844/vote -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"value": 1, "emoji": "🤔", "note": "optional"}'
curl -X POST /api/v1/records/arxiv/2603.01844/comments -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"body": "…", "review": true}'