Multi-Parameter Multi-Critical Metrology of the Dicke Model
Critical quantum metrology exploits the hypersensitivity of quantum systems near phase transitions to achieve enhanced precision in parameter estimation. While single-parameter estimation near critical points is well established, the simultaneous estimation of multiple parameters, which is essential for practical sensing applications, remains challenging. This difficulty arises from sloppiness, a phenomenon that typically renders the quantum Fisher information matrix (QFIM) singular or nearly singular. In this work, we demonstrate that multiparameter critical metrology is not only feasible…
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