Quantum Limits of Passive Optical Surface Metrology and Defect Detection

Jernej Frank, George Brumpton, Tommaso Tufarelli, Gerardo Adesso, Samanta Piano

arXivarxiv/2603.10796Mar 11, 2026quant-phscore 0

We develop a quantum statistical framework for passive optical surface metrology. Modelling a surface as an incoherent ensemble of point emitters imaged through a diffraction-limited system, we employ techniques from quantum parameter estimation and hypothesis testing to derive ultimate bounds for jointly estimating geometrical features and for deciding the presence or absence of surface defects, and we identify optimal measurements from the geometry of the point-spread-function manifold. As a representative application, we analyse a minimal surface crack model based on three point sources…

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