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Reliability Dynamics in a Two-Site Dissipative Quantum Spin Chain

Bowen Sun, D. L. Zhou

arXivarxiv/2603.11484Mar 12, 2026quant-phscore 0

As a key index for applications of a device, the device's reliability is its ability to survive (function normally over time) under the influence of some environment. In this paper we present a quantum energy-storing device model with a quantum spin chain, whose environment influence is described by the Lindblad master equation. Here the device survives if the spin system stays in the state with nonzero excitations; otherwise, it fails. Because the Lindblad dynamics enforces one-way energy decay and strict irreversibility of the failure state, we can investigate the reliability of the…

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