Quantifying surface losses in superconducting aluminum microwave resonators

Elizabeth Hedrick, Faranak Bahrami, Alexander C. Pakpour-Tabrizi, Atharv Joshi, Q. Rumman Rahman, Ambrose Yang, Ray D. Chang, Matthew P. Bland, Apoorv Jindal, Guangming Cheng, Nan Yao, Robert J. Cava, Andrew A. Houck, Nathalie P. de Leon

arXivarxiv/2603.13183Mar 13, 2026quant-phscore 0

The recent realization of millisecond-scale coherence with tantalum-on-silicon transmon qubits showed that depositing the Al/AlOx/Al Josephson junction in a high purity, ultrahigh vacuum environment was critical for achieving lifetime-limited coherence, motivating careful examination of the aluminum surface two-level system (TLS) bath. Here, we measure the microwave absorption arising from surface TLSs in superconducting aluminum resonators, following methodology developed for tantalum resonators. We vary film and surface properties and correlate microwave measurements with materials…

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