3D tomography of exchange phase in a Si/SiGe quantum dot device
The exchange interaction is a foundational building block for the operation of spin-based quantum processors. Extracting the exchange interaction coefficient $J(\mathbf{V})$, as a function of gate electrode voltages, is important for understanding disorder, faithfully simulating device performance, and operating spin qubits with high fidelity. Typical coherent measurements of exchange in spin qubit devices yield a modulated cosine of an accumulated phase, which in turn is the time integral of exchange. As such, extracting $J(\mathbf{V})$ from experimental data is difficult due to the…
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