Mathematical and experimental validation of the bifocusing method tailored for bistatic measurement
In this paper, we design a bifocusing-based imaging strategy for the rapid identification of small penetrable dielectric inhomogeneities within a two-dimensional bistatic measurement setup. To address the applicability and limitation, we carefully explore the mathematical structure of the indicator function by establishing a relationship involving the infinite series of Bessel functions, the material characteristics, and the bistatic angle. Through this theoretical result, we rigorously verify that the imaging resolution degrades as the bistatic angle approaches $\SI{180}{\degree}$, and…
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