Scalable linearized gate set tomography
Characterizing errors on many-qubit quantum computers remains a key challenge to understanding and improving the performance of these devices. Current characterization methods either don't scale beyond a few qubits, or make simplifying assumptions (such as assuming stochastic Pauli error) that obscure the underlying physical error mechanisms. In this work, we present a scalable extension to gate set tomography-linearized gate set tomography-that enables characterization of many-qubit systems. Linearized gate set tomography relies on sparse error models, a linear approximation to enable…
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