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Defect engineering of ultrathin gallium nitride via electric fields for advanced electronic, magnetic, and gas sensing applications

Yujia Tian, Devesh R. Kripalani, Ming Xue, Kun Zhou

arXivarxiv/2605.26817May 26, 2026cond-mat.mtrl-sciscore 0

Scaling wide-band-gap semiconductors to the ultrathin limit offers a transformative pathway for power electronics, with gallium nitride (GaN) representing a cornerstone material in this class. However, the operational resilience and functional tunability of its two-dimensional form (g-GaN) remain underexplored. This work shifts the focus from idealized systems to the complex materials behavior under realistic conditions, investigating how the synergistic effects of point vacancy defects, strain, and external electric fields govern its electronic, magnetic, and sensing landscapes. We…

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