Learning Midcircuit Measurement Backaction from Three Repeated Measurements

Chia-Tung Chu, Su-un Lee, Han Zheng, Senrui Chen, Bibek Pokharel, Alireza Seif, Liang Jiang

arXivarxiv/2606.00433May 29, 2026quant-phscore 0

Accurate modeling of midcircuit measurements (MCMs) is essential for dynamic-circuit operations such as syndrome extraction, measurement-based reset, and the separation of state-preparation and measurement error. Unlike terminal measurement, a noisy MCM both produces a classical outcome and alters the incoming quantum state, thereby influencing subsequent circuit operations. This makes conventional confusion-matrix or fidelity-level characterization insufficient. Here, we introduce an efficient, self-consistent protocol for learning a single-qubit Z-twirled MCM instrument, retaining the…

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