Circuit-Level Noise Estimation via Shuttling in Plaquette Circuits
We present a method for estimating QEC circuit-level noise levels assuming that only single-shot measurements are available (e.g. measurements are slow and performed in a zoned/parallel fashion), and that lower level quantum hardware calibration is not possible (e.g. cloud access) or not feasible (e.g. large scale computing). We develop and run surface code plaquette experiments using two syndrome qubit configurations: FRESH, involving fresh qubits for each plaquette repetition, and RECYCLE, reusing qubits. To validate our approach, we compile plaquettes to ion-trap (IonQ Aria1) native gate…
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