Traceable In Situ Microwave Power Measurement at the Cryogenic Device Plane in a Dilution Refrigerator

Paolo Panetta, Andrea Celotto, Alessandro Alocco, Bernardo Galvano, Luca Fasolo, Emanuele Palumbo, Luca Callegaro, Luca Oberto, Patrizia Livreri, Emanuele Enrico

arXivarxiv/2607.12751Jul 14, 2026physics.ins-detscore 0

Accurate knowledge of the microwave power delivered to a cryogenic device under test (DUT) is essential for the characterization and operation of superconducting quantum circuits. However, this information is difficult to obtain inside dilution refrigerators because of distributed attenuation, impedance mismatch, switch-path repeatability, and temperature-dependent microwave components. This paper presents an in situ measurement method for RF power at the cryogenic device plane. The method uses a custom variable temperature stage (VTS) as a cryogenic thermal-transfer element. The TVS is…

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