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Hardness and Complexity Transition of Noisy Random Circuit Sampling

Byeongseon Go, Changhun Oh, Hyunseok Jeong

arXivarxiv/2607.20804Jul 23, 2026quant-phscore 0

Random circuit sampling (RCS) is a leading candidate for demonstrating quantum advantage, supported by strong complexity-theoretic evidence of hardness in the ideal setting and by rapid experimental progress to date. In practice, however, noise is unavoidable, and a central problem is to identify the noise-strength boundary between classically simulable and classically hard regimes. In this work, we establish an architecture-general hardness bound for this boundary for the standard local depolarizing noise of strength $γ$. Assuming the standard average-case #P-hardness conjecture for ideal…

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