Electron shuttling as a probe for charge defects
Silicon spin qubits are a leading platform for scalable quantum computing, but their performance is limited by charge noise, widely attributed to two-level fluctuators (TLFs). The location of individual TLFs is generally unknown, and existing methods to localise them does not scale favourably with device size. Here, we show that electron shuttling turns a single mobile spin into a scanning probe of individual defects. We show that by shuttling a spin over a range of distances and tracking its coherence loss, one can localise defects along the channel and constrain their switching rate and…
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