Near-optimal quantum metrology with few-qubit measurements

Liang Mao, Senrui Chen, Hsin-Yuan Huang, John Preskill, Sisi Zhou

arXivarxiv/2608.01617Aug 3, 2026quant-phscore 0

Quantum metrology, which addresses parameter estimation in quantum systems, has broad applications across science and technology. Conventional metrology protocols for multi-qubit states in the multi-parameter regime typically require highly complex quantum measurements, leading to substantial quantum-resource costs. In this work, we introduce a family of metrology protocols that use only few-qubit measurements, thereby significantly reducing the required resources. For arbitrary pure states, one of our protocols approaches the quantum Cramér-Rao bound up to an overhead in sample complexity…

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