Exponential logical-error reduction in quantum memories via optimal syndrome-measurement timing
Syndrome-measurement timing is usually treated as a fixed clock cycle of a quantum error-correcting code. For quantum memories, however, the inter-round interval is itself an optimizable control parameter: measuring too rarely allows idling errors to accumulate, whereas measuring too often introduces measurement-induced faults. We propose a phenomenological logical-noise model for this trade-off and analytically show that the optimal syndrome-measurement interval is inversely proportional to the code distance and that this produces an exponential reduction of logical-error rates in the…
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