Projection measurement of the comb basis through free-electron-photon interactions
Free electrons, driven by rapid advances in photon-induced near-field electron microscopy, have emerged as a promising platform for quantum information processing, including quantum computing and quantum sensing. However, conventional measurements that rely on the electron energy loss spectrum (EELS) are inherently destructive to electron qubits, thereby constraining their applicability. In this Letter, we propose a scheme that performs projection measurement on the electron comb basis, where high measurement precision can be achieved with bright squeezed vacuum states and strong PINEM…
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