Open Research Index

Characterization of surjective isometries: the real case

Tianbao Guo, Jinghao Huang

arXivarxiv/2608.24567Aug 25, 2026math.FAscore 0

Let $(Ω,μ)$ and $(Λ,λ)$ be complete atomless localizable semifinite measure spaces. Suppose that $E(Ω,μ)$ and $F(Λ,λ)$ are real rearrangement-invariant Banach function spaces with order-continuous norms, in the Banach-lattice sense, and that neither norm is proportional to the $L_2$-norm. Every surjective real-linear isometry $U:E(Ω,μ)\longrightarrow F(Λ,λ)$ has the form $Uf=wΦ(f)$, where $w$ has full support and $Φ$ is induced by a complete measure-class Boolean isomorphism. Both factors are uniquely determined by $U$. Let $(\mathcal{M},τ)$ and $(\mathcal{N},ν)$ be atomless semifinite von…

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