Fabrication-free assessment of microwave losses in germanium-based dielectrics and superconductors

Haoran Lu, Kushagra Aggarwal, Xiangqin Wang, Pauline Drexler, Daniel Tong, Maciej W. Olszewski, Anand Ithepalli, Lingda Kong, Debdeep Jena, Peter L. McMahon, David A. Muller, Dominique Bougeard, Valla Fatemi

arXivarxiv/2608.28463Aug 28, 2026quant-phscore 0

We present a flip-chip-based sensing scheme to measure effective microwave losses associated with target materials for quantum technologies, without requiring any device fabrication on the material under test. Using this approach, we quantify the microwave losses of a strain-engineered Ge/SiGe quantum well heterostructure and investigate losses arising from its Ge substrate and intermediate layers. The quality factors of the fabricated microwave resonators agree with the losses of dielectric materials independently extracted from flip-chip sensing measurements. We further study the…

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