Rapid and high-sensitive NV-based microwave field imaging via digital lock-in amplification for on-chip microstrip diagnostics

Zijin Fu, Yanjie Liu, Hongliang Wu, Yuchen Han, Zhengtao Wang, Haolin Li, Dezhi Zheng, Bo Zhang, Jun Zhang

arXivarxiv/2609.05886Sep 5, 2026physics.opticsscore 0

High-resolution, high-sensitivity microwave (MW) magnetic field imaging is indispensable for non-destructive integrated circuit (IC) testing, radio-frequency device characterization, and spintronic research. Yet, the practical utility of these techniques is severely constrained by the pervasive challenge of isolating weak magnetic signatures from intense optical and electronic noise, which fundamentally limits both acquisition speed and detection sensitivity. Here, we overcome this barrier by introducing a wide-field imaging scheme based on an ensemble of diamond nitrogen-vacancy (NV)…

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