ELIPPS: Exact Learning for Inverse Problems from Partial Self-supervision
In undersampled inverse problems (such as sparse-view computed tomography), only a small number of measurements are collected, which reduces radiation exposure and acquisition time and cost, and can also address the inaccessibility of certain acquisition arrangements. Most learning-based methods for such problems require supervision in the form of fully sampled measurements and ground-truth images, which are costly or even infeasible to acquire. To overcome this issue, we propose \emph{Exact Learning for Inverse Problems from Partial Self-supervision} (ELIPPS), an incomplete self-supervised…
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