Pendellösung length-scale neutron and X-ray interferometry

Owen Lailey, Alexandre Boutot, David G. Cory, Joseph P. Cotter, Vishal Dhamgaye, Tao Hong, Michael G. Huber, Young-June Kim, Winfried Kockelmann, Jeremy W. Paster, Dusan Sarenac, Kawal Sawhney, Naume Shentevski, Ivar Taminiau, Dmitry A. Pushin

arXivarxiv/2609.24709Sep 21, 2026physics.app-phscore 0

Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major…

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