Simultaneous Drift Calibration and Reconstruction for Scanning-Probe X-Ray Tomography
Scanning-probe x-ray tomography is useful for imaging nanoscale structures of a sample. The image resolution, which can reach down to 10 nm by the increased brightness and coherence of the x-ray optics, however, is highly susceptible to experimental error. Failure to address these errors can lead to a smeared image and, in the worst case, to misinterpretation of the imaged object's structure. In this work, we present a novel optimization-based approach to calibrate a common yet challenging source of experimental error, the drifts of the scanning positions, while simultaneously reconstructing…
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