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Predicting electric-field noise in ion traps using fluctuation electrodynamics

Markus Teller, Da An, Alberto M. Alonso, Philip C. Holz, Philipp Schindler, Hartmut Häffner, Tracy E. Northup

arXivarxiv/2610.01693Oct 1, 2026quant-phscore 0

Electric-field noise in microfabricated surface ion traps contributes to gate errors in trapped-ion quantum computers, but this noise has been challenging to predict. Here, we present a method to predict the electric-field noise arising from fluctuations in the bulk of dielectric and metallic materials. The method is valid for arbitrary trap geometries, and the only relevant material property is energy loss. We apply it to an ion trap with an electrically floating electrode and find the contribution from dielectrics to be dominant. Our model predicts the observed noise for this trap within a…

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