A boundary integral method for computing electron repulsion integrals in heterogeneous dielectric environments
We present a boundary integral method for evaluating electron repulsion integrals (ERIs) in dielectric environments of piecewise constant permittivity. This generalizes conventional bare-Coulomb ERIs by incorporating screening from structured dielectric surroundings, such as the substrates and/or encapsulating layers present in modern two-dimensional-material devices. We formulate the problem as a second-kind boundary integral equation for the induced surface charge on the dielectric interfaces, and discretize it with a Nyström method on adaptively refined panels. The incident potential…
Comments and reviews
No comments yet.
API
curl /api/v1/records/arxiv/2610.26745
curl -X POST /api/v1/records/arxiv/2610.26745/vote -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"value": 1, "emoji": "🤔", "note": "optional"}'
curl -X POST /api/v1/records/arxiv/2610.26745/comments -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"body": "…", "review": true}'