Material criteria for angular-momentum transfer from twisted photons to photoelectrons
We study the material requirements for transferring the total-angular-momentum (TAM) projection of a twisted photon to the orbital angular momentum (OAM) of a photoelectron emitted from an $n$-type semiconductor surface. Within a single-valley effective-mass model of surface photoemission, we calculate OAM-resolved spectra for GaAs, InSb, $\mathrm{InAs}_{0.34}\mathrm{Sb}_{0.66}$, and $\mathrm{Hg}_{0.76}\mathrm{Cd}_{0.24}\mathrm{Te}$ irradiated by twisted photons with Laguerre--Gaussian--like momentum profile. The OAM transfer is characterized by the mean electron OAM, its root-mean-squared…
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