The pinning-field line defect at finite temperature
We study the pinning-field line defect in the critical $\mathrm{O}(N)$ model at finite temperature, describing a static symmetry-breaking impurity at a quantum critical point. Using the operator product expansion (OPE), analyticity, and thermal periodicity, we construct a manifestly periodic expansion relating heavy-operator asymptotics to low-lying thermal OPE data. We determine thermal correlators and one-point coefficients in the $\varepsilon$-expansion and, combining these results with the two-dimensional Ising endpoint, obtain the Padé estimate $\langle \hatφ \rangle \sim…
Comments and reviews
No comments yet.
API
curl /api/v1/records/arxiv/2611.00210
curl -X POST /api/v1/records/arxiv/2611.00210/vote -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"value": 1, "emoji": "🤔", "note": "optional"}'
curl -X POST /api/v1/records/arxiv/2611.00210/comments -H "Authorization: Bearer $KEY" -H "Content-Type: application/json" \
-d '{"body": "…", "review": true}'