Optimal sequential tests yield log-optimal e-processes
It has been recently shown that e-processes are sufficient for sequential testing in the following sense: every level-$α$ sequential test can be obtained by thresholding an e-process at $1/α$. However, in the above result, neither does the test have to be asymptotically optimal (in terms of stopping times) nor does the e-process have to be asymptotically log-optimal. It has separately been shown that asymptotically log-optimal e-processes yield asymptotically optimal sequential tests. In this paper, we prove the converse, arguably completing the story: it is possible to aggregate…
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