Gate induced strain on a two-dimensional hole gas in silicon

D. van der Bovenkamp, C. S. A. Müller, B. D. Pantiru, I. Bošnjak, M. Cignoni, Q. Torrent Nicolau, M. E. Bal, S. Wiedmann, J. Ridderbos, F. A. Zwanenburg

arXivarxiv/2607.07932Jul 8, 2026cond-mat.mes-hallscore 0

We show the effect of gate-induced strain on the valence band of a silicon (Si) metal oxide semiconductor (MOS) confined two-dimensional hole gas (2DHG). Increasing aluminum gate thickness, and thereby the strain in the channel, results in the onset of a second subband contributing to Shubnikov-de Haas oscillations. Temperature-dependent magnetotransport measurements reveal distinct cyclotron masses of $m_c^*=(0.36\pm0.04)m_0$ and $m_c^*=(0.49\pm0.02)m_0$. The measured cyclotron masses differ from those expected for an idealized heavy-hole (HH)/light-hole (LH) picture, reflecting the…

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